Recently, my colleague Robert Ruiz described a new approach to scan test that utilizes the high-speed I/O (HSIO) ports that exist on most chips. The benefits of this new approach include reduced test ...

Mark Burns is a TI Fellow at Texas Instruments, Incorporated and an accomplished expert in the mixed-signal IC test and measurement area. Burns was encouraged to develop this book by TI over the past ...

1.1.1 Analog, Digital, or Mixed-Signal? Before delving into the details of mixed-signal IC test and measurement, one might first ask a few good questions. Exactly what are mixed-signal circuits? How ...

Source: Siemens EDA These in-system tests with embedded deterministic patterns also support the reuse of existing test infrastructure. They allow IC designers to reuse existing IJTAG- and SSN-based ...

GHz Bandwidth for All RF Applications, Solves Test Challenges for Wide-Bandwidth Applications, Including Wi-Fi 7 and UWB Wave ...