Source: Siemens EDA These in-system tests with embedded deterministic patterns also support the reuse of existing test infrastructure. They allow IC designers to reuse existing IJTAG- and SSN-based ...
Mark Burns is a TI Fellow at Texas Instruments, Incorporated and an accomplished expert in the mixed-signal IC test and measurement area. Burns was encouraged to develop this book by TI over the past ...
Recently, my colleague Robert Ruiz described a new approach to scan test that utilizes the high-speed I/O (HSIO) ports that exist on most chips. The benefits of this new approach include reduced test ...
He has presented IC test solutions at various semiconductor conferences and published numerous articles about ATE topics. He holds an Electronic Engineer degree from the University of Applied ...
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