Recently, my colleague Robert Ruiz described a new approach to scan test that utilizes the high-speed I/O (HSIO) ports that exist on most chips. The benefits of this new approach include reduced test ...

Mark Burns is a TI Fellow at Texas Instruments, Incorporated and an accomplished expert in the mixed-signal IC test and measurement area. Burns was encouraged to develop this book by TI over the past ...

TOKYO, Nov. 18, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled the Wave Scale RF20ex instrument for the V93000 EXA Scale ...

Scalable Card Offers Future-Proof 100MHz–20GHz Bandwidth for All RF Applications, Solves Test Challenges for Wide-Bandwidth Applications, Including Wi-Fi 7 and UWB TOKYO, Nov. 18, 2024 (GLOBE NEWSWIRE ...